Conference Review
2024 4th International Conference on Measurement Control and Instrumentation (MCAI 2024) was held in Guangzhou Hongde International Hotel on August 24, 2024. The conference was hosted by Guangdong Measurement and Control Technology and Equipment Application Promotion Association and Guangzhou Instrumentation Society, and co-organized by Guangdong Society for Measurement, Automation and Information Engineering Magazine and AEIC Academic Exchange Information Center. The conference was held online and offline. A total of 310 members from the Measurement and Control Promotion Association attended the conference. In addition, more than 50 experts and scholars from 20+ universities and research institutes including Nanjing University of Aeronautics and Astronautics, China Institute of Metrology, Sun Yat-sen University, Guangdong University of Technology, South China Normal University and Guangzhou University attended the academic conference.
A. Member Congress of Guangdong Measurement and Control Technology and Equipment Application Promotion Association
B. Award Ceremony
C. Keynote Speech
Prof. Yaohua Deng, Guangdong University of Technology, China
Speech title: Research on the Application of Multimodal Large Model in the Defect Detection of Precision Electronic Components
Prof. Zixin Wang, Sun Yat-sen University, China
Speech Title: Research progress and application of phase-locked amplification technology
D. Oral Presentation
E. High-tech and Product Exchange
This conference discussed the latest research trends and application prospects in the field of measurement control technology and instrumentation, and achieved complete success. The conference will continue to explore the technology of cutting-edge theory in this field. We look forward to the next conference to continue to promote the scientific and technological progress and talent development in the field of measurement control and instrumentation, and build a broader exchange platform for experts, scholars and enterprise personnel in related fields.